Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7109189
Preview
| Coordinates | 7109189.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 2,7-bis((trimethylsilyl)ethynyl)cyclopenta[hi]aceanthrylene |
|---|---|
| Formula | C28 H26 Si2 |
| Calculated formula | C28 H26 Si2 |
| SMILES | C[Si](C)(C#Cc1c2cccc3c2c(c2cccc4c(C#C[Si](C)(C)C)cc3c24)c1)C |
| Title of publication | Ambipolar organic semiconductors from electron-accepting cyclopenta-fused anthracene |
| Authors of publication | Hai Xia; Danqing Liu; Xiaomin Xua; Qian Miao |
| Journal of publication | Chem.Commun. |
| Year of publication | 2013 |
| Journal volume | 49 |
| Pages of publication | 4301 |
| a | 6.1885 ± 0.001 Å |
| b | 6.8198 ± 0.0012 Å |
| c | 16.531 ± 0.003 Å |
| α | 82.438 ± 0.003° |
| β | 87.22 ± 0.003° |
| γ | 63.216 ± 0.003° |
| Cell volume | 617.36 ± 0.19 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0773 |
| Residual factor for significantly intense reflections | 0.0619 |
| Weighted residual factors for significantly intense reflections | 0.1694 |
| Weighted residual factors for all reflections included in the refinement | 0.1875 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7109189.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.