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Information card for entry 7110676
Preview
Coordinates | 7110676.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H86 Li4 O4 Si8 |
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Calculated formula | C45 H86 Li4 O4 Si8 |
SMILES | [C]1234=[C]56[C]78=[C]9%10%11[C]%12%131[C]1%14%15[Li]4%12([C]42([Li]36([C]5([Si]([C]27[Li]8%10([C]9([Li]%11%131[O]1CCCC1)([Si]%15(C)C)[Si](C)(C)C[Si]2(C)C)[O]1CCCC1)(C)C)[Si](C)(C)C[Si]4(C)C)[O]1CCCC1)[Si](C)(C)C[Si]%14(C)C)[O]1CCCC1 |
Title of publication | Isolation and characterization of the tetralithium salt of [5]radialene tetraanion stabilized by silyl groups |
Authors of publication | Matsuo, Tsukasa; Fure, Hidetoshi; Sekiguchi, Akira |
Journal of publication | Chemical Communications |
Year of publication | 1999 |
Journal issue | 19 |
Pages of publication | 1981 |
a | 48.328 ± 0.003 Å |
b | 13.47 ± 0.001 Å |
c | 21.676 ± 0.001 Å |
α | 90° |
β | 115.003 ± 0.003° |
γ | 90° |
Cell volume | 12788.2 ± 1.4 Å3 |
Cell temperature | 180 K |
Ambient diffraction temperature | 295 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0775 |
Residual factor for significantly intense reflections | 0.0775 |
Weighted residual factors for significantly intense reflections | 0.2358 |
Weighted residual factors for all reflections included in the refinement | 0.2358 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.947 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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