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Information card for entry 7110814
Preview
Coordinates | 7110814.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H62 Fe N4 O10 |
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Calculated formula | C66 H62 Fe N4 O10 |
SMILES | [Fe]12345678([c]9([cH]1[cH]2[cH]3[cH]49)C(=O)C)[c]1([cH]8[cH]7[cH]6[cH]51)C(=O)C.Oc1cc(O)c2cc1C(C)c1c(O)cc(O)c(c1)C(C)c1c(O)cc(O)c(c1)C(C)c1c(O)cc(O)c(c1)C2C.n1ccc(cc1)c1ccncc1.n1ccc(cc1)c1ccncc1 |
Title of publication | Entrapment of ferrocenes within supramolecular, deep-cavity resorcin[4]arenes |
Authors of publication | MacGillivray, Leonard R.; Spinney, Heather A.; Reid, Jennifer L.; Ripmeester, John A. |
Journal of publication | Chemical Communications |
Year of publication | 2000 |
Journal issue | 6 |
Pages of publication | 517 |
a | 18.8082 ± 0.0009 Å |
b | 11.9478 ± 0.0006 Å |
c | 25.5945 ± 0.0011 Å |
α | 90° |
β | 108.306 ± 0.001° |
γ | 90° |
Cell volume | 5460.4 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0588 |
Residual factor for significantly intense reflections | 0.0443 |
Weighted residual factors for all reflections | 0.1168 |
Weighted residual factors for significantly intense reflections | 0.1082 |
Goodness-of-fit parameter for all reflections | 1.055 |
Goodness-of-fit parameter for significantly intense reflections | 1.115 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7110814.html
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Users of the data should acknowledge the original authors of the
structural data.