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Information card for entry 7111001
Preview
| Coordinates | 7111001.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H12 Co4 O13 S2 |
|---|---|
| Calculated formula | C22 H12 Co4 O13 S2 |
| SMILES | [Co]12([Co]3(C#[O])(C#[O])(C#[O])[C]41=[C]23[C]12[Co]3([Co]1(C#[O])(C#[O])(C#[O])[C]=23CSCCOCCSC4)(C#[O])(C#[O])C#[O])(C#[O])(C#[O])C#[O] |
| Title of publication | The formation of sulfur macrocycles containing dialkyne units |
| Authors of publication | Davies, John E.; Hope-Weeks, Louisa J.; Mays, Martin J.; Raithby, Paul R. |
| Journal of publication | Chemical Communications |
| Year of publication | 2000 |
| Journal issue | 15 |
| Pages of publication | 1411 |
| a | 9.392 ± 0.0002 Å |
| b | 16.392 ± 0.0007 Å |
| c | 18.502 ± 0.0007 Å |
| α | 90° |
| β | 90.255 ± 0.002° |
| γ | 90° |
| Cell volume | 2848.42 ± 0.17 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0606 |
| Residual factor for significantly intense reflections | 0.0349 |
| Weighted residual factors for significantly intense reflections | 0.0573 |
| Weighted residual factors for all reflections included in the refinement | 0.0637 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7111001.html
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Users of the data should acknowledge the original authors of the
structural data.