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Information card for entry 7111017
Preview
Coordinates | 7111017.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C28 H72 Cu2 N4 O2 P2 Si4 |
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Calculated formula | C28 H72 Cu2 N4 O2 P2 Si4 |
SMILES | C[Si](C)(N1[Cu]2([N](=P1(C(C)(C)C)C(C)(C)C)[Si](C)(C)C)[OH][Cu]1([N](=P(N1[Si](C)(C)C)(C(C)(C)C)C(C)(C)C)[Si](C)(C)C)[OH]2)C |
Title of publication | A neutral dicopper(iii) bis(μ-oxo) complex from a copper(i) ethylene iminophosphanamide and O2 |
Authors of publication | Straub, Bernd F.; Rominger, Frank; Hofmann, Peter |
Journal of publication | Chemical Communications |
Year of publication | 2000 |
Journal issue | 17 |
Pages of publication | 1611 |
a | 28.4009 ± 0.0007 Å |
b | 11.293 ± 0.0003 Å |
c | 16.937 ± 0.0005 Å |
α | 90° |
β | 126.604 ± 0.001° |
γ | 90° |
Cell volume | 4360.9 ± 0.2 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1108 |
Residual factor for significantly intense reflections | 0.0583 |
Weighted residual factors for significantly intense reflections | 0.1403 |
Weighted residual factors for all reflections included in the refinement | 0.1638 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7111017.html
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