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Information card for entry 7111347
Preview
| Coordinates | 7111347.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C58 H56 F12 N2 |
|---|---|
| Calculated formula | C58 H56 F12 N2 |
| SMILES | c1(cc(c(cc1C#Cc1cc(cc(c1)C(F)(F)F)C(F)(F)F)/C=C/c1ccc(N(CCCC)CCCC)cc1)C#Cc1cc(cc(c1)C(F)(F)F)C(F)(F)F)/C=C/c1ccc(cc1)N(CCCC)CCCC |
| Title of publication | Cruciform ?-systems: effect of aggregation on emissionElectronic supplementary information (ESI) available: X-ray data of 1?4 and electron diffraction (experimental and simulated) of 3. See http://www.rsc.org/suppdata/cc/b4/b406495j/ |
| Authors of publication | Wilson, James N.; Smith, Mark D.; Enkelmann, Volker; Bunz, Uwe H. F. |
| Journal of publication | Chemical Communications |
| Year of publication | 2004 |
| Journal issue | 15 |
| Pages of publication | 1700 - 1701 |
| a | 42.3302 ± 0.0015 Å |
| b | 5.1937 ± 0.0002 Å |
| c | 28.8208 ± 0.0011 Å |
| α | 90° |
| β | 128.214 ± 0.001° |
| γ | 90° |
| Cell volume | 4978.4 ± 0.3 Å3 |
| Cell temperature | 150 ± 1 K |
| Ambient diffraction temperature | 150 ± 1 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0675 |
| Residual factor for significantly intense reflections | 0.0541 |
| Weighted residual factors for significantly intense reflections | 0.1423 |
| Weighted residual factors for all reflections included in the refinement | 0.1497 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.056 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7111347.html
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Users of the data should acknowledge the original authors of the
structural data.