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Information card for entry 7112252
Preview
Coordinates | 7112252.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H47 P Si4 |
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Calculated formula | C24 H47 P Si4 |
SMILES | [Si]12([Si](P([Si]1(C(C)C)C(C)C)[Si]2(C(C)C)C(C)C)(C(C)C)C(C)C)c1ccccc1 |
Title of publication | Branched tetrasilane substituted phosphines ‒ synthesis and characterisation of PhSi(SiiPr2)3P and {PhSi(SiMe2)3}2P14 |
Authors of publication | Michael Feierabend; Carsten von Hanisch |
Journal of publication | Chem.Commun. |
Year of publication | 2014 |
Journal volume | 50 |
Pages of publication | 4416 |
a | 9.164 ± 0.003 Å |
b | 10.207 ± 0.003 Å |
c | 16.441 ± 0.009 Å |
α | 92.88 ± 0.04° |
β | 94.84 ± 0.04° |
γ | 110.34 ± 0.02° |
Cell volume | 1431.6 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0289 |
Residual factor for significantly intense reflections | 0.0247 |
Weighted residual factors for significantly intense reflections | 0.0657 |
Weighted residual factors for all reflections included in the refinement | 0.0673 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7112252.html
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