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Information card for entry 7112380
Preview
| Coordinates | 7112380.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54 H44 N4 Pt Si2 |
|---|---|
| Calculated formula | C54 H44 N4 Pt Si2 |
| SMILES | [Pt]123[n]4c5=C(c6n3c(C(=c3[n]2c(C(=c2n1c(=C(c4c(c5C#C[Si](C)(C)C)C#C[Si](C)(C)C)c1ccccc1)cc2)c1ccccc1)cc3)c1ccccc1)cc6)c1ccccc1 |
| Title of publication | Spin-state control of thermal and photochemical Bergman cyclization. |
| Authors of publication | Boerner, Leigh J. K.; Pink, Maren; Park, Hyunsoo; LeSueur, Amanda; Zaleski, Jeffrey M. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2013 |
| Journal volume | 49 |
| Journal issue | 21 |
| Pages of publication | 2145 - 2147 |
| a | 11.7158 ± 0.001 Å |
| b | 12.6374 ± 0.0011 Å |
| c | 17.109 ± 0.0014 Å |
| α | 73.831 ± 0.002° |
| β | 89.353 ± 0.002° |
| γ | 68.496 ± 0.002° |
| Cell volume | 2251.9 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0385 |
| Residual factor for significantly intense reflections | 0.0291 |
| Weighted residual factors for significantly intense reflections | 0.0577 |
| Weighted residual factors for all reflections included in the refinement | 0.0607 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Duplicate of | 7108938 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7112380.html
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Users of the data should acknowledge the original authors of the
structural data.