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Information card for entry 7113295
Preview
| Coordinates | 7113295.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H32 O4 S4 |
|---|---|
| Calculated formula | C42 H32 O4 S4 |
| SMILES | C12(SCCS2)c2ccc(cc2)Oc2ccc(cc2)Oc2ccc(C3(c4ccc(cc4)Oc4ccc(cc4)Oc4ccc1cc4)SCCS3)cc2 |
| Title of publication | Dithioacetalisation of PEEK: a general technique for the solubilisation and characterisation of semi-crystalline aromatic polyketones |
| Authors of publication | Colquhoun, Howard M.; Paoloni, Francois P. V.; Drew, Michael G. B.; Hodge, Philip |
| Journal of publication | Chemical Communications (Cambridge, United Kingdom) |
| Year of publication | 2007 |
| Journal issue | 32 |
| Pages of publication | 3365 - 3367 |
| a | 34.218 ± 0.006 Å |
| b | 11.2574 ± 0.0019 Å |
| c | 8.8953 ± 0.0015 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3426.5 ± 1 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.2002 |
| Residual factor for significantly intense reflections | 0.0931 |
| Weighted residual factors for significantly intense reflections | 0.2383 |
| Weighted residual factors for all reflections included in the refinement | 0.2881 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.792 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Duplicate of | 7102083 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7113295.html
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Users of the data should acknowledge the original authors of the
structural data.