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Information card for entry 7114289
Preview
Coordinates | 7114289.cif |
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Original paper (by DOI) | HTML |
Formula | C26 H16 N2 Pt |
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Calculated formula | C26 H16 N2 Pt |
SMILES | [Pt]12(c3c(c4[n]1c(c1[n]2cccc1)ccc4)cccc3)C#CC#Cc1ccccc1 |
Title of publication | [(C⁁N⁁N)Pt(CC)nR] (HC⁁N⁁N = 6-aryl-2,2′-bipyridine, n = 1‒4, R = aryl, SiMe3) as a new class of light-emitting materials and their applications in electrophosphorescent devicesElectronic supplementary information (ESI) available: General experimental procedure, analytical and spectral characterizations, OLED fabrication and performance. See http://www.rsc.org/suppdata/cc/b1/b108793b/ |
Authors of publication | Lu, Wei; Mi, Bao-Xiu; Chan, Michael C. W.; Hui, Zheng; Zhu, Nianyong; Lee, Shuit-Tong; Che, Chi-Ming |
Journal of publication | Chemical Communications |
Year of publication | 2002 |
Journal issue | 3 |
Pages of publication | 206 |
a | 15.268 ± 0.003 Å |
b | 12.626 ± 0.003 Å |
c | 10.929 ± 0.002 Å |
α | 90° |
β | 107.33 ± 0.03° |
γ | 90° |
Cell volume | 2011.2 ± 0.8 Å3 |
Cell temperature | 301 ± 2 K |
Ambient diffraction temperature | 301 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0559 |
Residual factor for significantly intense reflections | 0.034 |
Weighted residual factors for significantly intense reflections | 0.0825 |
Weighted residual factors for all reflections included in the refinement | 0.1042 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.956 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7114289.html
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