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Information card for entry 7114292
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Coordinates | 7114292.cif |
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Original paper (by DOI) | HTML |
Formula | C40 H52 N4 O4 Si |
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Calculated formula | C32 N2 O2 Si0.25 |
Title of publication | Structure and exchange in silicon-linked tetraradicalsElectronic supplementary information (ESI) available: EPR spectra, X-ray crystallographic data and packing views, synthetic and characterization details for 1a and 2, χT plot for 2, and computational summaries for model systems. See http://www.rsc.org/suppdata/cc/b1/b107430j/ |
Authors of publication | Liao, Yi; Baskett, Martha; Lahti, Paul M.; Palacio, Fernando |
Journal of publication | Chemical Communications |
Year of publication | 2002 |
Journal issue | 3 |
Pages of publication | 252 |
a | 16.661 ± 0.002 Å |
b | 16.661 ± 0.002 Å |
c | 7.0586 ± 0.0009 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1959.4 ± 0.4 Å3 |
Cell temperature | 298 K |
Number of distinct elements | 5 |
Space group number | 86 |
Hermann-Mauguin space group symbol | P 42/n :2 |
Hall space group symbol | -P 4bc |
Residual factor for all reflections | 0.315 |
Residual factor for significantly intense reflections | 0.246 |
Weighted residual factors for all reflections | 0.264 |
Weighted residual factors for significantly intense reflections | 0.218 |
Weighted residual factors for all reflections included in the refinement | 0.218 |
Goodness-of-fit parameter for all reflections | 4.832 |
Goodness-of-fit parameter for significantly intense reflections | 5.89 |
Goodness-of-fit parameter for all reflections included in the refinement | 5.89 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7114292.html
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