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Information card for entry 7114830
Preview
| Coordinates | 7114830.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H26 Fe Si |
|---|---|
| Calculated formula | C18 H26 Fe Si |
| SMILES | [Fe]123456789C%10([Si](C)(C)C%115[CH]6=[CH]7C([CH]8=[CH]9%11)(C)C)[CH]1=[CH]2C([CH]3=[CH]4%10)(C)C |
| Title of publication | Silicon-bridged bis(cyclohexadienyl) iron complexes: the first structurally characterised [14]ferrocenophaneElectronic supplementary information (ESI) available: experimental details and NMR spectroscopic data. See http://www.rsc.org/suppdata/cc/b1/b107874g/ |
| Authors of publication | Hascall, Tony; Drewitt, Mark J.; O′Hare, Dermot |
| Journal of publication | Chemical Communications |
| Year of publication | 2001 |
| Journal issue | 24 |
| Pages of publication | 2600 |
| a | 12.5115 ± 0.0003 Å |
| b | 8.2107 ± 0.0002 Å |
| c | 16.9607 ± 0.0004 Å |
| α | 90° |
| β | 103.003 ± 0.001° |
| γ | 90° |
| Cell volume | 1697.67 ± 0.07 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0361 |
| Residual factor for significantly intense reflections | 0.0302 |
| Weighted residual factors for significantly intense reflections | 0.0795 |
| Weighted residual factors for all reflections included in the refinement | 0.0833 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7114830.html
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