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Information card for entry 7115171
Preview
Coordinates | 7115171.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C17 Cl2 O16 Ru6 Sn |
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Calculated formula | C17 Cl2 O16 Ru6 Sn |
SMILES | [C]12345[Ru]6789([Sn](Cl)(Cl)[Ru]%10%1116([Ru]162([Ru]37([Ru]48%101(C#[O])(C#[O])C#[O])([Ru]59%116(C#[O])(C#[O])C#[O])(C#[O])(C#[O])C#[O])(C#[O])(C#[O])C#[O])(C#[O])C#[O])(C#[O])C#[O] |
Title of publication | High yield synthesis and crystal structures of the Ru6‒Sn cluster compounds [Ru6C(CO)16SnCl2] and [Ru6C(CO)16SnCl3]− |
Authors of publication | Hermans, Sophie; Johnson, Brian F. G. |
Journal of publication | Chemical Communications |
Year of publication | 2000 |
Journal issue | 19 |
Pages of publication | 1955 |
a | 16.74 ± 0.006 Å |
b | 16.5 ± 0.007 Å |
c | 20.941 ± 0.009 Å |
α | 90° |
β | 90.96 ± 0.02° |
γ | 90° |
Cell volume | 5783 ± 4 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0413 |
Residual factor for significantly intense reflections | 0.033 |
Weighted residual factors for all reflections | 0.0624 |
Weighted residual factors for significantly intense reflections | 0.0601 |
Goodness-of-fit parameter for all reflections | 1.036 |
Goodness-of-fit parameter for significantly intense reflections | 1.099 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7115171.html
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