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Information card for entry 7115222
Preview
Coordinates | 7115222.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C23 H29 N2 O7 P Si2 W |
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Calculated formula | C23 H29 N2 O7 P Si2 W |
SMILES | [W]([P]1(N=C(N=C1C(=O)OCC)c1ccccc1)C([Si](C)(C)C)[Si](C)(C)C)(C#[O])(C#[O])(C#[O])(C#[O])C#[O] |
Title of publication | Photochemically generated nitrilium phosphane-ylid tungsten complexes and their reactivity towards alkyne and nitrile derivatives |
Authors of publication | Streubel, Rainer; Wilkens, Hendrik; Jones, Peter G. |
Journal of publication | Chemical Communications |
Year of publication | 1999 |
Journal issue | 20 |
Pages of publication | 2127 |
a | 10.5466 ± 0.001 Å |
b | 10.701 ± 0.0011 Å |
c | 13.8717 ± 0.0014 Å |
α | 79.915 ± 0.003° |
β | 82.215 ± 0.003° |
γ | 75.406 ± 0.003° |
Cell volume | 1484.8 ± 0.3 Å3 |
Cell temperature | 143 ± 2 K |
Ambient diffraction temperature | 143 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0206 |
Residual factor for significantly intense reflections | 0.0186 |
Weighted residual factors for significantly intense reflections | 0.0433 |
Weighted residual factors for all reflections included in the refinement | 0.0438 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7115222.html
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