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Information card for entry 7115577
Preview
Coordinates | 7115577.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C50 H38 B Cl2 N5 O2 Pt |
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Calculated formula | C50 H38 B Cl2 N5 O2 Pt |
SMILES | [Pt]12(Cl)[n]3c(cccc3c3cccc[n]23)c2cccc[n]12.[Cl-].c1(c2[nH]c(C3=[O][B](OC(=C3)c3[nH]c(cc3)c3ccccc3)(c3ccccc3)c3ccccc3)cc2)ccccc1 |
Title of publication | Ion-based assemblies of planar anion complexes and cationic PtII complexes |
Authors of publication | Ryo Sekiya; Yusuke Tsutsui; Wookjin Choi; Tsuneaki Sakurai; Shu Seki; Yuya Bandoa; Hiromitsu Maeda |
Journal of publication | Chem.Commun. |
Year of publication | 2014 |
Journal volume | 50 |
Pages of publication | 10615 |
a | 12.2811 ± 0.0002 Å |
b | 12.5617 ± 0.0002 Å |
c | 26.9413 ± 0.0005 Å |
α | 90° |
β | 100.943 ± 0.0007° |
γ | 90° |
Cell volume | 4080.69 ± 0.12 Å3 |
Cell temperature | 93 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0731 |
Residual factor for significantly intense reflections | 0.0562 |
Weighted residual factors for significantly intense reflections | 0.1263 |
Weighted residual factors for all reflections included in the refinement | 0.1399 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
Diffraction radiation wavelength | 1.54187 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7115577.html
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