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Information card for entry 7115742
Preview
| Coordinates | 7115742.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H54 Al2 N6 O20 |
|---|---|
| Calculated formula | C40 H54 Al2 N6 O20 |
| SMILES | c12ccccc1C=[N]1c3cc4c([N]5=Cc6c(cccc6)O[Al]65([N]4=Cc4ccccc4O6)([OH2])[OH2])cc3[N]3=Cc4ccccc4O[Al]13(O2)([OH2])[OH2].N(=O)(=O)[O-].OC.CO.OC.N(=O)(=O)[O-].OC.OC.CO |
| Title of publication | Supramolecular control over recognition and efficient detection of picric acid |
| Authors of publication | Virginie Bereau; Carine Duhayon; Jean-Pascal Sutter |
| Journal of publication | Chem.Commun. |
| Year of publication | 2014 |
| Journal volume | 50 |
| Pages of publication | 12061 |
| a | 9.3142 ± 0.0015 Å |
| b | 11.313 ± 0.0017 Å |
| c | 11.6842 ± 0.0019 Å |
| α | 74.397 ± 0.007° |
| β | 88.276 ± 0.007° |
| γ | 70.465 ± 0.006° |
| Cell volume | 1115.1 ± 0.3 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1132 |
| Residual factor for significantly intense reflections | 0.0643 |
| Weighted residual factors for all reflections | 0.1191 |
| Weighted residual factors for significantly intense reflections | 0.0652 |
| Weighted residual factors for all reflections included in the refinement | 0.0652 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.1292 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7115742.html
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Users of the data should acknowledge the original authors of the
structural data.