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Information card for entry 7115764
Preview
Coordinates | 7115764.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | none |
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Chemical name | C8F-4ClPDI |
Formula | C40 H8 Cl4 F30 N2 O4 |
Calculated formula | C40 H8 Cl4 F30 N2 O4 |
SMILES | Clc1cc2C(=O)N(C(=O)c3cc(Cl)c4c5c(Cl)cc6C(=O)N(C(=O)c7cc(Cl)c(c1c4c23)c5c67)CC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F)CC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F |
Title of publication | High performance, air stable n-type single crystal transistors based on core-tetrachlorinated perylene diimides |
Authors of publication | Chunming Liu; Chengyi Xiao; Yan Li; Wenping Hu; Zhibo Li; Zhaohui Wang |
Journal of publication | Chem.Commun. |
Year of publication | 2014 |
Journal volume | 50 |
Pages of publication | 12462 |
a | 20.971 ± 0.009 Å |
b | 20.21 ± 0.009 Å |
c | 10.319 ± 0.005 Å |
α | 90° |
β | 95.733 ± 0.007° |
γ | 90° |
Cell volume | 4352 ± 3 Å3 |
Cell temperature | 173.15 K |
Ambient diffraction temperature | 173.15 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1118 |
Residual factor for significantly intense reflections | 0.096 |
Weighted residual factors for significantly intense reflections | 0.2436 |
Weighted residual factors for all reflections included in the refinement | 0.2576 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.198 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7115764.html
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structural data.