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Information card for entry 7115798
Preview
Coordinates | 7115798.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C80 H60 O4 Si4 |
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Calculated formula | C80 H60 O4 Si4 |
SMILES | C1(=C(C(=C(c2ccccc2)[Si]21O[Si](O[Si]1(C(=C(C(=C1c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)O[Si](O2)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1 |
Title of publication | High solid-state fluorescence in ring-shaped AEE-active tetraphenylsilole derivatives |
Authors of publication | Yuanjing Cai; Kerim Samedov; Haley Albright; Brian S. Dolinar; Ilia A. Guzei; Rongrong Hu; Chaocan Zhang; Ben Zhong Tang; Robert West |
Journal of publication | Chem.Commun. |
Year of publication | 2014 |
Journal volume | 50 |
Pages of publication | 12714 |
a | 11.226 ± 0.003 Å |
b | 12.704 ± 0.003 Å |
c | 13.186 ± 0.003 Å |
α | 115.699 ± 0.004° |
β | 103.433 ± 0.005° |
γ | 101.434 ± 0.005° |
Cell volume | 1549.3 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100.01 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0685 |
Residual factor for significantly intense reflections | 0.0442 |
Weighted residual factors for significantly intense reflections | 0.0952 |
Weighted residual factors for all reflections included in the refinement | 0.1046 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7115798.html
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