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Information card for entry 7115805
Preview
Coordinates | 7115805.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 5,12-bis((triisopropylsilyl)ethynyl)tetracene 1,2,3,4-tetrachloro-6, 11-bis((triisopropylsilyl)ethynyl)-5,12-diazatetracene |
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Formula | C38 H46 Cl4 N2 Si2 |
Calculated formula | C38 H46 Cl4 N2 Si2 |
SMILES | [Si](C#Cc1c2nc3c(Cl)c(Cl)c(Cl)c(Cl)c3nc2c(C#C[Si](C(C)C)(C(C)C)C(C)C)c2c1cccc2)(C(C)C)(C(C)C)C(C)C |
Title of publication | Synthesis, solution-processed thin film transistors and solid solutions of silylethynylated diazatetracenes |
Authors of publication | Xiaomin Xu; Bowen Shan; Sergii Kalytchuk; Minghua Xie; Shuaijun Yang; Danqing Liu; Stephen V. Kershaw; Qian Miao |
Journal of publication | Chem.Commun. |
Year of publication | 2014 |
Journal volume | 50 |
Pages of publication | 12828 |
a | 35.4482 ± 0.0019 Å |
b | 15.1828 ± 0.0008 Å |
c | 14.9575 ± 0.0008 Å |
α | 90° |
β | 103.908 ± 0.001° |
γ | 90° |
Cell volume | 7814.2 ± 0.7 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1275 |
Residual factor for significantly intense reflections | 0.0751 |
Weighted residual factors for significantly intense reflections | 0.2067 |
Weighted residual factors for all reflections included in the refinement | 0.2537 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.078 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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