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Information card for entry 7116668
Preview
Coordinates | 7116668.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H96 O Si4 |
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Calculated formula | C72 H96 O Si4 |
SMILES | c12ccc3c(c4ccccc4c(c3c1c1c(ccc3c(c4ccccc4c(c13)C#C[Si](C(C)C)(C(C)C)C(C)C)C#C[Si](C(C)C)(C(C)C)C(C)C)o2)C#C[Si](C(C)C)(C(C)C)C(C)C)C#C[Si](C(C)C)(C(C)C)C(C)C |
Title of publication | Isolation of a 1,4-diketone intermediate in oxidative dimerization of 2-hydroxyanthracene and its conversion to oxahelicene |
Authors of publication | Takashi Matsuno; Yutaro Koyama; Satoru Hiroto; Jatish Kumar; Tsuyoshi Kawai; Hiroshi Shinokubo |
Journal of publication | Chem.Commun. |
Year of publication | 2015 |
Journal volume | 51 |
Pages of publication | 4607 |
a | 13.7114 ± 0.0007 Å |
b | 19.2562 ± 0.0011 Å |
c | 25.0769 ± 0.0013 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6621 ± 0.6 Å3 |
Cell temperature | 93 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 4 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0455 |
Residual factor for significantly intense reflections | 0.0388 |
Weighted residual factors for significantly intense reflections | 0.087 |
Weighted residual factors for all reflections included in the refinement | 0.0908 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7116668.html
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