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Information card for entry 7116975
Preview
Coordinates | 7116975.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H30 N O |
---|---|
Calculated formula | C28 H32 N2 O2 |
SMILES | c1(cc(c(/C=C/c2ccncc2)cc1OCCCC)OCCCC)/C=C/c1ccncc1 |
Title of publication | Role of synergistic pi-pi stacking and X-H^...^Cl (X = C, N, O) H-bonding interactions in gelation and gel phase crystallization |
Authors of publication | Subham Bhattacharjee; Santanu Bhattacharya |
Journal of publication | Chem.Commun. |
Year of publication | 2015 |
Journal volume | 51 |
Pages of publication | 7019 |
a | 27.745 ± 0.009 Å |
b | 27.745 ± 0.009 Å |
c | 6.4943 ± 0.0014 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4999 ± 3 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 4 |
Space group number | 88 |
Hermann-Mauguin space group symbol | I 41/a :2 |
Hall space group symbol | -I 4ad |
Residual factor for all reflections | 0.1714 |
Residual factor for significantly intense reflections | 0.0668 |
Weighted residual factors for significantly intense reflections | 0.1669 |
Weighted residual factors for all reflections included in the refinement | 0.1993 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.953 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7116975.html
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