Information card for entry 7117464
| Formula |
C26 H18 |
| Calculated formula |
C26 H18 |
| SMILES |
c1ccccc1c1ccc2c(c1)cc1ccc(c3ccccc3)cc1c2 |
| Title of publication |
Thin film field-effect transistors of 2,6-diphenyl anthracene (DPA) |
| Authors of publication |
Liu, Jie; Dong, Huanli; Wang, Zongrui; Ji, Deyang; Cheng, Changli; Geng, Hua; Zhang, Hantang; Zhen, Yonggang; Jiang, Lang; Fu, Hongbing; Bo, Zhishan; Chen, Wei; Shuai, Zhigang; Hu, Wenping |
| Journal of publication |
Chemical Communications (Cambridge, United Kingdom) |
| Year of publication |
2015 |
| Journal volume |
51 |
| Journal issue |
59 |
| Pages of publication |
11777 - 11779 |
| a |
17.973 ± 0.008 Å |
| b |
7.352 ± 0.003 Å |
| c |
6.245 ± 0.003 Å |
| α |
90° |
| β |
90.646 ± 0.009° |
| γ |
90° |
| Cell volume |
825.1 ± 0.6 Å3 |
| Cell temperature |
113 ± 2 K |
| Ambient diffraction temperature |
113 ± 2 K |
| Number of distinct elements |
2 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0788 |
| Residual factor for significantly intense reflections |
0.0563 |
| Weighted residual factors for significantly intense reflections |
0.1314 |
| Weighted residual factors for all reflections included in the refinement |
0.1471 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.071 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7117464.html