Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7118258
Preview
Coordinates | 7118258.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H42 Cl6 Cu2 N6 |
---|---|
Calculated formula | C38 H42 Cl6 Cu2 N6 |
SMILES | C12N(C=CN1Cc1[n](cccc1)[Cu]1([Cu]=2(Cl)[n]2c(CN3C=1N(C=C3)c1c(cc(cc1C)C)C)cccc2)Cl)c1c(cc(cc1C)C)C.C(Cl)Cl.C(Cl)Cl |
Title of publication | Cuprophilic interactions in highly luminescent dicopper(i)-NHC-picolyl complexes - fast phosphorescence or TADF? |
Authors of publication | Nitsch, Jörn; Lacemon, Frederick; Lorbach, Andreas; Eichhorn, Antonius; Cisnetti, Federico; Steffen, Andreas |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2016 |
Journal volume | 52 |
Journal issue | 14 |
Pages of publication | 2932 - 2935 |
a | 8.2153 ± 0.0008 Å |
b | 11.1662 ± 0.001 Å |
c | 11.5343 ± 0.0011 Å |
α | 85.272 ± 0.003° |
β | 84.43 ± 0.003° |
γ | 77.543 ± 0.003° |
Cell volume | 1026.24 ± 0.17 Å3 |
Cell temperature | 290 K |
Ambient diffraction temperature | 290 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0467 |
Residual factor for significantly intense reflections | 0.0337 |
Weighted residual factors for significantly intense reflections | 0.0973 |
Weighted residual factors for all reflections included in the refinement | 0.1175 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.161 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7118258.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.