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Information card for entry 7118404
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| Coordinates | 7118404.cif |
|---|
| Formula | C68 H44 O14 |
|---|---|
| Calculated formula | C68 H44 O14 |
| SMILES | O=C(O)c1ccc(c2cc3c(cc2c2ccc(cc2)C(=O)O)c2cc(c(cc2c2cc(c(cc32)c2ccc(cc2)C(=O)O)c2ccc(cc2)C(=O)O)c2ccc(cc2)C(=O)O)c2ccc(cc2)C(=O)O)cc1.O=C(OC)c1ccccc1 |
| Title of publication | Polymorphs of layered assemblies of hydrogen-bonded hexagonal networks caused by conformational frustration |
| Authors of publication | Ichiro Hisaki; Nobuaki Ikenaka; Norimitsu Tohnai; Mikiji Miyata |
| Journal of publication | Chem.Commun. |
| Year of publication | 2016 |
| Journal volume | 52 |
| Pages of publication | 300 |
| a | 19.1278 ± 0.0002 Å |
| b | 22.403 ± 0.0002 Å |
| c | 22.3984 ± 0.0002 Å |
| α | 60.046 ± 0.0006° |
| β | 87.4093 ± 0.0005° |
| γ | 81.0545 ± 0.0004° |
| Cell volume | 8209.05 ± 0.14 Å3 |
| Cell temperature | 93 K |
| Ambient diffraction temperature | 93 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.134 |
| Residual factor for significantly intense reflections | 0.1248 |
| Weighted residual factors for significantly intense reflections | 0.426 |
| Weighted residual factors for all reflections included in the refinement | 0.4451 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.687 |
| Diffraction radiation wavelength | 0.8 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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