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Information card for entry 7118435
Preview
| Coordinates | 7118435.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H42 Ni O P2 |
|---|---|
| Calculated formula | C31 H42 Ni O P2 |
| SMILES | C12c3c(cccc3)[P](C(C)C)(C(C)C)[Ni]2(Oc2ccccc2)[P](c2c1cccc2)(C(C)C)C(C)C |
| Title of publication | Activation of Si-H bonds across the nickel carbene bond in electron rich nickel PCcarbeneP pincer complexes. |
| Authors of publication | LaPierre, Etienne A.; Piers, Warren E.; Spasyuk, Denis M.; Bi, David W. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2016 |
| Journal volume | 52 |
| Journal issue | 7 |
| Pages of publication | 1361 - 1364 |
| a | 30.7146 ± 0.0004 Å |
| b | 10.0835 ± 0.0001 Å |
| c | 20.284 ± 0.0003 Å |
| α | 90° |
| β | 114.295 ± 0.001° |
| γ | 90° |
| Cell volume | 5725.82 ± 0.13 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0828 |
| Residual factor for significantly intense reflections | 0.0777 |
| Weighted residual factors for significantly intense reflections | 0.1902 |
| Weighted residual factors for all reflections included in the refinement | 0.1996 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7118435.html
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