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Information card for entry 7118450
Preview
Coordinates | 7118450.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H56 Cl6 F Ga N2 P2 |
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Calculated formula | C45 H56 Cl6 F Ga N2 P2 |
SMILES | c1(n(c(c([n+]1c1c(cccc1C(C)C)C(C)C)Cl)Cl)c1c(cccc1C(C)C)C(C)C)/P=P/c1c(cccc1C(C)C)C(C)C.c1(ccccc1)F.Cl[Ga](Cl)(Cl)[Cl-] |
Title of publication | [((Cl)Im(Dipp))P[double bond, length as m-dash]P(Dipp)][GaCl4]: a polarized, cationic diphosphene. |
Authors of publication | Schwedtmann, Kai; Holthausen, Michael H.; Sala, Chris H.; Hennersdorf, Felix; Fröhlich, Roland; Weigand, Jan J. |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2016 |
Journal volume | 52 |
Journal issue | 7 |
Pages of publication | 1409 - 1412 |
a | 10.7484 ± 0.0006 Å |
b | 13.6179 ± 0.0007 Å |
c | 33.6481 ± 0.0018 Å |
α | 90° |
β | 94.25 ± 0.001° |
γ | 90° |
Cell volume | 4911.6 ± 0.5 Å3 |
Cell temperature | 153 ± 1 K |
Ambient diffraction temperature | 153 ± 1 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0835 |
Residual factor for significantly intense reflections | 0.0663 |
Weighted residual factors for significantly intense reflections | 0.1762 |
Weighted residual factors for all reflections included in the refinement | 0.1849 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.117 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7118450.html
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