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Information card for entry 7118633
Preview
Coordinates | 7118633.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40.5 H40.5 Cl1.5 N4 O2 S4 |
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Calculated formula | C40 H40 N4 O2 S4 |
Title of publication | Thionated perylene diimides with intense absorbance in the near-IR. |
Authors of publication | Llewellyn, Ben A.; Davies, E. Stephen; Pfeiffer, Constance R.; Cooper, Mick; Lewis, William; Champness, Neil R. |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2016 |
Journal volume | 52 |
Journal issue | 10 |
Pages of publication | 2099 - 2102 |
a | 12.8268 ± 0.0014 Å |
b | 13.2644 ± 0.0013 Å |
c | 24.5245 ± 0.0007 Å |
α | 96.008 ± 0.005° |
β | 95.267 ± 0.006° |
γ | 118.65 ± 0.011° |
Cell volume | 3593.1 ± 0.7 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1863 |
Residual factor for significantly intense reflections | 0.1488 |
Weighted residual factors for significantly intense reflections | 0.3777 |
Weighted residual factors for all reflections included in the refinement | 0.4157 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.264 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/7118633.html
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