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Information card for entry 7118783
Preview
Coordinates | 7118783.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 1_Pen |
---|---|
Formula | C30 H50 O4 Rh2 S2 |
Calculated formula | C30 H50 O4 Rh2 S2 |
SMILES | [Rh]1234567([Rh]89%10%11(S(S1(=O)=O)(=O)=O)([c]1([c]8([c]9([c]%10([c]%111C)C)C)C)CCCCC)(C6)C7)[c]1([c]5([c]4([c]3([c]21C)C)C)C)CCCCC |
Title of publication | Photoinduced bending of rod-like millimetre-size crystals of a rhodium dithionite complex with n-pentyl moieties. |
Authors of publication | Nakai, Hidetaka; Matsuba, Kengo; Akimoto, Masataka; Nozaki, Tomonori; Matsumoto, Takahiro; Isobe, Kiyoshi; Irie, Masahiro; Ogo, Seiji |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2016 |
Journal volume | 52 |
Journal issue | 23 |
Pages of publication | 4349 - 4352 |
a | 13.97 ± 0.006 Å |
b | 25.545 ± 0.01 Å |
c | 8.975 ± 0.004 Å |
α | 90° |
β | 97.362 ± 0.005° |
γ | 90° |
Cell volume | 3176 ± 2 Å3 |
Cell temperature | 108 K |
Ambient diffraction temperature | 108 K |
Number of distinct elements | 5 |
Space group number | 9 |
Hermann-Mauguin space group symbol | C 1 c 1 |
Hall space group symbol | C -2yc |
Residual factor for all reflections | 0.0338 |
Residual factor for significantly intense reflections | 0.0311 |
Weighted residual factors for significantly intense reflections | 0.0649 |
Weighted residual factors for all reflections included in the refinement | 0.0664 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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