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Information card for entry 7119021
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Coordinates | 7119021.cif |
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Chemical name | m-xylene2_Bp_ExP6 |
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Formula | C78 H80 O8 |
Calculated formula | C78 H80 O8 |
SMILES | C1c2c(cc(c(c2)OC)Cc2cc(OC)c(cc2OC)Cc2ccc(c3ccc(cc3)Cc3c(cc(c(c3)OC)Cc3c(OC)cc(c(OC)c3)Cc3ccc(cc3)c3ccc1cc3)OC)cc2)OC.c1ccc(cc1C)C.c1ccc(cc1C)C |
Title of publication | A high-yield synthesis of [m]biphenyl-extended pillar[n]arenes for an efficient selective inclusion of toluene and m-xylene in the solid state |
Authors of publication | Bo Gao; Li-Li Tan; Nan Song; Ke Li; Ying-Wei Yang |
Journal of publication | Chem.Commun. |
Year of publication | 2016 |
Journal volume | 52 |
Pages of publication | 5804 |
a | 11.3535 ± 0.0013 Å |
b | 11.5292 ± 0.0013 Å |
c | 13.4501 ± 0.0015 Å |
α | 70.421 ± 0.002° |
β | 73.067 ± 0.002° |
γ | 78.916 ± 0.002° |
Cell volume | 1578.1 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0933 |
Residual factor for significantly intense reflections | 0.056 |
Weighted residual factors for significantly intense reflections | 0.1309 |
Weighted residual factors for all reflections included in the refinement | 0.1532 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.004 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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