Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7119659
Preview
| Coordinates | 7119659.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | (SiHP2)Cu(CbzI) |
|---|---|
| Formula | C37 H46 Cu I2 N P2 Si |
| Calculated formula | C37 H46 Cu I2 N P2 Si |
| SMILES | [Cu]12([P](c3c([Si]([H]2)(C)c2c([P]1(C(C)C)C(C)C)cccc2)cccc3)(C(C)C)C(C)C)n1c2ccc(I)cc2c2cc(I)ccc12 |
| Title of publication | σ-Complexation as a strategy for designing copper-based light emitters. |
| Authors of publication | Kim, Yeong-Eun; Kim, Jin; Park, Joon Woo; Park, Kiyoung; Lee, Yunho |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2017 |
| Journal volume | 53 |
| Journal issue | 19 |
| Pages of publication | 2858 - 2861 |
| a | 9.9714 ± 0.0006 Å |
| b | 20.0277 ± 0.001 Å |
| c | 19.2707 ± 0.0011 Å |
| α | 90° |
| β | 90.215 ± 0.002° |
| γ | 90° |
| Cell volume | 3848.4 ± 0.4 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1033 |
| Residual factor for significantly intense reflections | 0.09 |
| Weighted residual factors for significantly intense reflections | 0.229 |
| Weighted residual factors for all reflections included in the refinement | 0.2357 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7119659.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.