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Information card for entry 7119659
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Coordinates | 7119659.cif |
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Original paper (by DOI) | HTML |
Common name | (SiHP2)Cu(CbzI) |
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Formula | C37 H46 Cu I2 N P2 Si |
Calculated formula | C37 H46 Cu I2 N P2 Si |
SMILES | [Cu]12([P](c3c([Si]([H]2)(C)c2c([P]1(C(C)C)C(C)C)cccc2)cccc3)(C(C)C)C(C)C)n1c2ccc(I)cc2c2cc(I)ccc12 |
Title of publication | σ-Complexation as a strategy for designing copper-based light emitters. |
Authors of publication | Kim, Yeong-Eun; Kim, Jin; Park, Joon Woo; Park, Kiyoung; Lee, Yunho |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2017 |
Journal volume | 53 |
Journal issue | 19 |
Pages of publication | 2858 - 2861 |
a | 9.9714 ± 0.0006 Å |
b | 20.0277 ± 0.001 Å |
c | 19.2707 ± 0.0011 Å |
α | 90° |
β | 90.215 ± 0.002° |
γ | 90° |
Cell volume | 3848.4 ± 0.4 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1033 |
Residual factor for significantly intense reflections | 0.09 |
Weighted residual factors for significantly intense reflections | 0.229 |
Weighted residual factors for all reflections included in the refinement | 0.2357 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7119659.html
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