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Information card for entry 7121052
Preview
Coordinates | 7121052.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H28 P2 Pt |
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Calculated formula | C22 H28 P2 Pt |
SMILES | C(#Cc1ccccc1)[Pt](C#Cc1ccccc1)([P](C)(C)C)[P](C)(C)C |
Title of publication | Multiply "trapped" <sup>3</sup>[trans-Pt(PR<sub>3</sub>)<sub>2</sub>(C[triple bond, length as m-dash]CC<sub>6</sub>H<sub>4</sub>X)<sub>2</sub>]* conformers in rigid media. |
Authors of publication | Marineau-Plante, Gabriel; Juvenal, Frank; Langlois, Adam; Fortin, Daniel; Soldera, Armand; Harvey, Pierre D. |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2018 |
Journal volume | 54 |
Journal issue | 8 |
Pages of publication | 976 - 979 |
a | 23.3735 ± 0.0018 Å |
b | 5.7621 ± 0.0004 Å |
c | 17.435 ± 0.0013 Å |
α | 90° |
β | 111.762 ± 0.002° |
γ | 90° |
Cell volume | 2180.8 ± 0.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0433 |
Residual factor for significantly intense reflections | 0.028 |
Weighted residual factors for significantly intense reflections | 0.079 |
Weighted residual factors for all reflections included in the refinement | 0.0854 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.128 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7121052.html
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