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Information card for entry 7123644
Preview
| Coordinates | 7123644.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C92 H82 Cl6 N4 O2 S2 Se2 |
|---|---|
| Calculated formula | C92 H82 Cl6 N4 O2 S2 Se2 |
| Title of publication | Fused Selenophene-thieno[3,2-b]thiophene-selenophene (ST)-based Narrow Bandgap Electron Acceptor for Efficient Organic Solar Cells with Small Voltage Loss |
| Authors of publication | Liao, Xunfan; Shi, Xueliang; Zhang, Ming; Gao, Ke; Zuo, Lijian; Liu, Feng; Chen, Yiwang; Jen, Alex K. Y. |
| Journal of publication | Chemical Communications |
| Year of publication | 2019 |
| a | 17.568 ± 0.007 Å |
| b | 21.991 ± 0.011 Å |
| c | 21.812 ± 0.009 Å |
| α | 90° |
| β | 104.87 ± 0.02° |
| γ | 90° |
| Cell volume | 8145 ± 6 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.6563 |
| Residual factor for significantly intense reflections | 0.2413 |
| Weighted residual factors for significantly intense reflections | 0.4403 |
| Weighted residual factors for all reflections included in the refinement | 0.6663 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.888 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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