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Information card for entry 7125086
Preview
| Coordinates | 7125086.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H20 F6 S12 Sb |
|---|---|
| Calculated formula | C20 H20 F6 S12 Sb |
| Title of publication | Anion size control of the packing in the metallic versus semiconducting chiral radical cation salts (DM-EDT-TTF)<sub>2</sub>XF<sub>6</sub> (X = P, As, Sb). |
| Authors of publication | Pop, Flavia; Auban-Senzier, Pascale; Canadell, Enric; Avarvari, Narcis |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2016 |
| Journal volume | 52 |
| Journal issue | 84 |
| Pages of publication | 12438 - 12441 |
| a | 6.6529 ± 0.0007 Å |
| b | 8.4663 ± 0.0003 Å |
| c | 15.2766 ± 0.0011 Å |
| α | 87.151 ± 0.006° |
| β | 77.495 ± 0.007° |
| γ | 68.478 ± 0.007° |
| Cell volume | 781.06 ± 0.11 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 1 |
| Hermann-Mauguin space group symbol | P 1 |
| Hall space group symbol | P 1 |
| Residual factor for all reflections | 0.0907 |
| Residual factor for significantly intense reflections | 0.0531 |
| Weighted residual factors for significantly intense reflections | 0.1354 |
| Weighted residual factors for all reflections included in the refinement | 0.1523 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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