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Information card for entry 7126452
Preview
| Coordinates | 7126452.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H5 N3 O5 |
|---|---|
| Calculated formula | C14 H5 N3 O5 |
| Title of publication | Nitroaromatics as n-type organic semiconductors for field effect transistors. |
| Authors of publication | Niazi, Muhammad Rizwan; Hamzehpoor, Ehsan; Ghamari, Pegah; Perepichka, Igor F.; Perepichka, Dmitrii F. |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2020 |
| Journal volume | 56 |
| Journal issue | 47 |
| Pages of publication | 6432 - 6435 |
| a | 5.0814 ± 0.0002 Å |
| b | 6.9825 ± 0.0003 Å |
| c | 17.0804 ± 0.0008 Å |
| α | 90° |
| β | 93.994 ± 0.002° |
| γ | 90° |
| Cell volume | 604.56 ± 0.05 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0374 |
| Residual factor for significantly intense reflections | 0.0356 |
| Weighted residual factors for significantly intense reflections | 0.1015 |
| Weighted residual factors for all reflections included in the refinement | 0.1047 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7126452.html
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Users of the data should acknowledge the original authors of the
structural data.