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Information card for entry 7127238
Preview
| Coordinates | 7127238.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H20 B10 |
|---|---|
| Calculated formula | C16 H20 B10 |
| SMILES | [C]1234([C]567(C#Cc8ccccc8)[BH]891[BH]1%105[BH]5%116[BH]627[BH]273[BH]356[BH]51%11[BH]18%10[BH]492[BH]7351)c1ccccc1 |
| Title of publication | A new type of carborane-based electron-accepting material. |
| Authors of publication | Lee, Sunhee; Shin, Jisu; Ko, Doo-Hyun; Han, Won-Sik |
| Journal of publication | Chemical communications (Cambridge, England) |
| Year of publication | 2020 |
| Journal volume | 56 |
| Journal issue | 84 |
| Pages of publication | 12741 - 12744 |
| a | 7.2684 ± 0.0006 Å |
| b | 10.407 ± 0.001 Å |
| c | 12.7741 ± 0.0013 Å |
| α | 74.227 ± 0.003° |
| β | 81.33 ± 0.003° |
| γ | 86.111 ± 0.003° |
| Cell volume | 918.89 ± 0.15 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.111 |
| Residual factor for significantly intense reflections | 0.0597 |
| Weighted residual factors for significantly intense reflections | 0.1319 |
| Weighted residual factors for all reflections included in the refinement | 0.1559 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7127238.html
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Users of the data should acknowledge the original authors of the
structural data.