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Information card for entry 7130980
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Jmol._Canvas2D (Jmol) "jmolApplet0"[x]
Coordinates | 7130980.cif |
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Original paper (by DOI) | HTML |
Chemical name | '(3,6-diphenylthieno[3,4-b]thiophene-2,4-diyl)bis(phenylmethanone)' |
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Formula | C32 H20 O2 S2 |
Calculated formula | C32 H20 O2 S2 |
SMILES | s1c2c(c(c3ccccc3)c1C(=O)c1ccccc1)c(sc2c1ccccc1)C(=O)c1ccccc1 |
Title of publication | Direct access to thieno[3,4-b]thiophenes via elemental sulfur-promoted sulfurative tetramerization of acetophenones |
Authors of publication | Nguyen, Thanh Binh; Retailleau, Pascal |
Journal of publication | Chemical Communications |
Year of publication | 2022 |
a | 12.0865 ± 0.0006 Å |
b | 12.4636 ± 0.0006 Å |
c | 17.3007 ± 0.0008 Å |
α | 90° |
β | 104.435 ± 0.005° |
γ | 90° |
Cell volume | 2523.9 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0588 |
Residual factor for significantly intense reflections | 0.0434 |
Weighted residual factors for significantly intense reflections | 0.1075 |
Weighted residual factors for all reflections included in the refinement | 0.1166 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7130980.html
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