Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7151767
Preview
Coordinates | 7151767.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H21 B F2 N4 O7 S |
---|---|
Calculated formula | C25 H21 B F2 N4 O7 S |
SMILES | S(=O)(=O)(Oc1ccc(C2=c3[n](c(cc3C)C)[B](F)(n3c2c(cc3C)C)F)cc1)c1c(cc(N(=O)=O)cc1)N(=O)=O |
Title of publication | Highly selective fluorescent OFF-ON thiol probes based on dyads of BODIPY and potent intramolecular electron sink 2,4-dinitrobenzenesulfonyl subunits. |
Authors of publication | Guo, Huimin; Jing, Yingying; Yuan, Xiaolin; Ji, Shaomin; Zhao, Jianzhang; Li, Xiaohuan; Kan, Yanyan |
Journal of publication | Organic & biomolecular chemistry |
Year of publication | 2011 |
Journal volume | 9 |
Journal issue | 10 |
Pages of publication | 3844 - 3853 |
a | 16.6953 ± 0.0006 Å |
b | 17.6555 ± 0.0007 Å |
c | 17.3203 ± 0.0006 Å |
α | 90° |
β | 96.247 ± 0.002° |
γ | 90° |
Cell volume | 5075.1 ± 0.3 Å3 |
Cell temperature | 273 ± 2 K |
Ambient diffraction temperature | 273 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0904 |
Residual factor for significantly intense reflections | 0.0567 |
Weighted residual factors for significantly intense reflections | 0.1588 |
Weighted residual factors for all reflections included in the refinement | 0.1737 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7151767.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.