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Information card for entry 7200272
Preview
| Coordinates | 7200272.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C43 H92 Ag3 N3 P6 S3 Se3 |
|---|---|
| Calculated formula | C43 H92 Ag3 N3 P6 S3 Se3 |
| Title of publication | The CVD of silver selenide films from dichalcogenophosphinato and imidodichalcogenodiphosphinatosilver(I) single-source precursors |
| Authors of publication | Panneerselvam, Arunkumar; Nguyen, Chinh Q.; Malik, Mohammad A.; O'Brien, Paul; Raftery, James |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2009 |
| Journal volume | 19 |
| Journal issue | 3 |
| Pages of publication | 419 |
| a | 8.4966 ± 0.001 Å |
| b | 16.6904 ± 0.0019 Å |
| c | 21.628 ± 0.003 Å |
| α | 90.657 ± 0.002° |
| β | 91.134 ± 0.002° |
| γ | 90.768 ± 0.002° |
| Cell volume | 3066 ± 0.7 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0961 |
| Residual factor for significantly intense reflections | 0.0685 |
| Weighted residual factors for significantly intense reflections | 0.1319 |
| Weighted residual factors for all reflections included in the refinement | 0.1454 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.129 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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