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Information card for entry 7202021
Preview
Coordinates | 7202021.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C73 H169 Ag6 Cl3 N6 P12 S12 |
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Calculated formula | C73 H169 Ag6 Cl3 N6 P12 S12 |
SMILES | [Ag]12[S]=P(C(C)C)(C(C)C)N=P(C(C)C)(C(C)C)[S]1[Ag]1[S]=P(C(C)C)(C(C)C)N=P(C(C)C)(C(C)C)[S]1[Ag]1[S]=P(C(C)C)(C(C)C)N=P(C(C)C)(C(C)C)[S]21.C(Cl)(Cl)Cl |
Title of publication | The CVD of silver sulfide and silver thin films from a homoleptic crystalline single-source precursor |
Authors of publication | Panneerselvam, Arunkumar; Malik, Mohammad A.; O'Brien, Paul; Raftery, James |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2008 |
Journal volume | 18 |
Journal issue | 27 |
Pages of publication | 3264 |
a | 25.5883 ± 0.0013 Å |
b | 14.0036 ± 0.0007 Å |
c | 33.5098 ± 0.0017 Å |
α | 90° |
β | 107.722 ± 0.001° |
γ | 90° |
Cell volume | 11437.7 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0709 |
Residual factor for significantly intense reflections | 0.0476 |
Weighted residual factors for significantly intense reflections | 0.0676 |
Weighted residual factors for all reflections included in the refinement | 0.0725 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.986 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7202021.html
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