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Information card for entry 7202225
Preview
Coordinates | 7202225.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | KP23 |
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Formula | C15 H20 O Zr |
Calculated formula | C15 H20 O Zr |
SMILES | [Zr]123456789(OC)(C)[c]%10([cH]1[cH]2[cH]3[cH]4%10)C(C)(C)[c]15[cH]6[cH]7[cH]8[cH]91 |
Title of publication | Deposition of ZrO2 and HfO2 thin films by liquid injection MOCVD and ALD using ansa-metallocene zirconium and hafnium precursors |
Authors of publication | Black, Kate; Aspinall, Helen C.; Jones, Anthony C.; Przybylak, Katarzyna; Bacsa, John; Chalker, Paul R.; Taylor, Stephen; Zhao, Ce Zhou; Elliott, Simon D.; Zydor, Aleksandra; Heys, Peter N. |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2008 |
Journal volume | 18 |
Journal issue | 38 |
Pages of publication | 4561 |
a | 7.6566 ± 0.0007 Å |
b | 14.2184 ± 0.0013 Å |
c | 12.4639 ± 0.0011 Å |
α | 90° |
β | 91.546 ± 0.002° |
γ | 90° |
Cell volume | 1356.4 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0208 |
Residual factor for significantly intense reflections | 0.019 |
Weighted residual factors for significantly intense reflections | 0.0486 |
Weighted residual factors for all reflections included in the refinement | 0.0496 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7202225.html
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