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Information card for entry 7202472
Preview
Coordinates | 7202472.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C70 H88 S3 |
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Calculated formula | C70 H88 S3 |
SMILES | s1c(ccc1c1sc(cc1)c1cc2c(cc1)c1c(cccc1)C2(CCCCCCCC)CCCCCCCC)c1sc(cc1)c1cc2c(cc1)c1c(cccc1)C2(CCCCCCCC)CCCCCCCC |
Title of publication | Solid-state assemblies and optical properties of conjugated oligomers combining fluorene and thiophene units |
Authors of publication | Mathieu Surin; Prashant Sonar; Andrew C. Grimsdale; Klaus Müllen; Steven De Feyter; Satoshi Habuchi; Stefano Sarzi; Els Braeken; An Ver Heyen; Mark Van der Auweraer; Frans C. De Schryver; Massimiliano Cavallini; Jean-François Moulin; Fabio Biscarini; Cristina Femoni; Roberto Lazzaroni; Philippe Leclère |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2007 |
Journal volume | 17 |
Journal issue | 8 |
Pages of publication | 728 |
a | 17.432 ± 0.006 Å |
b | 18.687 ± 0.006 Å |
c | 21.199 ± 0.007 Å |
α | 83.439 ± 0.007° |
β | 66.224 ± 0.007° |
γ | 89.876 ± 0.006° |
Cell volume | 6271 ± 4 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2555 |
Residual factor for significantly intense reflections | 0.0858 |
Weighted residual factors for significantly intense reflections | 0.1723 |
Weighted residual factors for all reflections included in the refinement | 0.2265 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.918 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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