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Information card for entry 7202873
Preview
Coordinates | 7202873.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H16 Mo3 N6 S32 |
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Calculated formula | C26 H16 Mo3 N6 S32 |
SMILES | [Mo]1234567([Mo]89%10%11%12([Mo]%13%14%151([S]28)([S]5[S]6%13)([S]%10[S]%11%14)Sc1nsnc1S%15)([S]3[S]49)Sc1nsnc1S%12)Sc1nsnc1S7.S1C(SC2=C1SCCS2)=C1SC2=C(S1)SCCS2.S1C(SC2=C1SCCS2)=C1SC2=C(S1)SCCS2 |
Title of publication | Structural diversity in charge transfer salts based on Mo3S7 and Mo3S4Se3 clusters complexes and bis(ethylenedithio)tetrathiafulvalene (ET) |
Authors of publication | Alberola, Antonio; Llusar, Rosa; Triguero, Sonia; Vicent, Cristian; Sokolov, Maxim N.; Gómez-García, Carlos |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2007 |
Journal volume | 17 |
Journal issue | 32 |
Pages of publication | 3440 |
a | 14.4374 ± 0.0006 Å |
b | 21.6924 ± 0.0009 Å |
c | 17.2853 ± 0.0007 Å |
α | 90° |
β | 103.744 ± 0.001° |
γ | 90° |
Cell volume | 5258.4 ± 0.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0469 |
Residual factor for significantly intense reflections | 0.027 |
Weighted residual factors for significantly intense reflections | 0.0748 |
Weighted residual factors for all reflections included in the refinement | 0.0859 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.988 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7202873.html
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Users of the data should acknowledge the original authors of the
structural data.