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Information card for entry 7203055
Preview
Coordinates | 7203055.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C96 H106 Er2 N4 O12 |
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Calculated formula | C96 H106 Er2 N4 O12 |
SMILES | c1ccc2ccc3ccc[n]4c3c2[n]1[Er]12354([O]=C(O1)c1ccc(cc1)CCCCC)[O]=C(O[Er]14([n]6cccc7ccc8ccc[n]1c8c67)([O]=C(O4)c1ccc(cc1)CCCCC)([O]=C(O3)c1ccc(cc1)CCCCC)(OC(=[O]2)c1ccc(cc1)CCCCC)[O]=C(O5)c1ccc(cc1)CCCCC)c1ccc(cc1)CCCCC |
Title of publication | Solution-processable erbium‒ytterbium complex for potential planar optical amplifier application |
Authors of publication | Song, Limei; Liu, Xinhou; Zhen, Zhen; Chen, Cong; Zhang, Daming |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2007 |
Journal volume | 17 |
Journal issue | 43 |
Pages of publication | 4586 |
a | 22.3238 ± 0.0011 Å |
b | 10.0035 ± 0.0005 Å |
c | 38.1841 ± 0.0018 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 8527.1 ± 0.7 Å3 |
Cell temperature | 113 ± 2 K |
Ambient diffraction temperature | 113 ± 2 K |
Number of distinct elements | 5 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0572 |
Residual factor for significantly intense reflections | 0.0509 |
Weighted residual factors for significantly intense reflections | 0.0826 |
Weighted residual factors for all reflections included in the refinement | 0.0845 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.282 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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