Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7203145
Preview
Coordinates | 7203145.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Dodecithiophene |
---|---|
Formula | C120 H170 S12 |
Calculated formula | C120 H170 S12 |
SMILES | c1cc(c(c2ccc(c3sc(cc3)c3sc(cc3CCCCCCCCCCCC)c3sc(c(c3)CCCCCCCCCCCC)c3sc(cc3)c3sc(c4sc(c5sc(c6sc(c7ccc(c8c(ccs8)CCCCCCCCCCCC)s7)cc6)c(c5)CCCCCCCCCCCC)cc4CCCCCCCCCCCC)cc3)s2)s1)CCCCCCCCCCCC |
Title of publication | The longest oligothiophene ever examined by X-ray structure analysis |
Authors of publication | Azumi, Reiko; Mena-Osteritz, Elena; Boese, Roland; Benet-Buchholz, Jordi; Bäuerle, Peter |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2006 |
Journal volume | 16 |
Journal issue | 8 |
Pages of publication | 728 |
a | 9.617 ± 0.003 Å |
b | 13.895 ± 0.003 Å |
c | 21.695 ± 0.006 Å |
α | 87.83 ± 0.011° |
β | 84.549 ± 0.009° |
γ | 72.903 ± 0.01° |
Cell volume | 2758.3 ± 1.3 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1777 |
Residual factor for significantly intense reflections | 0.063 |
Weighted residual factors for significantly intense reflections | 0.1135 |
Weighted residual factors for all reflections included in the refinement | 0.1445 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.796 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7203145.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.