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Information card for entry 7203211
Preview
| Coordinates | 7203211.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C18 H44 N8 O12 Pt S8 |
|---|---|
| Calculated formula | C18 H44 N8 O12 Pt S8 |
| SMILES | C(N)(N)=[S][Pt]([S]=C(N)N)([S]=C(N)N)[S]=C(N)N.CS(C)=O.C1([O-])=C([O-])C(=O)C(=O)C(=O)C1=O.O=S(C)C.O.CS(C)=O.CS(C)=O.O |
| Title of publication | Tetrakis(thiourea)platinum(ii) oxocarbodianions salts as molecular building blocks for the synthesis of hydrogen bonded networks in the solid state |
| Authors of publication | Gale, Philip A.; Light, Mark E.; Quesada, Roberto |
| Journal of publication | CrystEngComm |
| Year of publication | 2006 |
| Journal volume | 8 |
| Journal issue | 2 |
| Pages of publication | 178 |
| a | 21.409 ± 0.004 Å |
| b | 14.734 ± 0.003 Å |
| c | 14.767 ± 0.003 Å |
| α | 90° |
| β | 127.24 ± 0.03° |
| γ | 90° |
| Cell volume | 3708.4 ± 1.9 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.048 |
| Residual factor for significantly intense reflections | 0.028 |
| Weighted residual factors for significantly intense reflections | 0.0465 |
| Weighted residual factors for all reflections included in the refinement | 0.0516 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7203211.html
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