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Information card for entry 7203575
Preview
| Coordinates | 7203575.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H50 Cd N6 O7 |
|---|---|
| Calculated formula | C44 H46.5 Cd N6 O7 |
| Title of publication | Synthesis of co-ordination networks selecting from either (<i>R,R</i>), (<i>S,S</i>) and (<i>R,S</i>)-1,4- or -1,3-bis[2-(4-pyridyl)-2-methylethyl]benzene and a discrete complex from 1,4-bis[2-(3-pyridyl)-2-methyl-<i>cis</i>-ethenyl)]benzene |
| Authors of publication | M. John Plater; Thomas Gelbrich; Michael B. Hursthouse; Ben M. De Silva |
| Journal of publication | CrystEngComm |
| Year of publication | 2006 |
| Journal volume | 8 |
| Journal issue | 12 |
| Pages of publication | 895 |
| a | 11.2284 ± 0.0016 Å |
| b | 13.9722 ± 0.0019 Å |
| c | 14.47 ± 0.003 Å |
| α | 104.476 ± 0.004° |
| β | 97.445 ± 0.005° |
| γ | 99.866 ± 0.007° |
| Cell volume | 2129.9 ± 0.6 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2044 |
| Residual factor for significantly intense reflections | 0.1343 |
| Weighted residual factors for significantly intense reflections | 0.1864 |
| Weighted residual factors for all reflections included in the refinement | 0.2092 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.223 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7203575.html
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