Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7203692
Preview
Coordinates | 7203692.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C47 H35 Ir N2 O2 |
---|---|
Calculated formula | C47 H35 Ir N2 O2 |
SMILES | [Ir]123(OC(=CC(=[O]1)C)C)([n]1c(c4c2cccc4)cc(c2ccccc12)c1ccccc1)[n]1c(c2c3cccc2)cc(c2ccccc12)c1ccccc1 |
Title of publication | Tuning the emission and morphology of cyclometalated iridium complexes and their applications to organic light-emitting diodes |
Authors of publication | Wu, Fang-Iy; Su, Huei-Jen; Shu, Ching-Fong; Luo, Liyang; Diau, Wei-Guang; Cheng, Chien-Hong; Duan, Jiun-Pey; Lee, Gene-Hsiang |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2005 |
Journal volume | 15 |
Journal issue | 10 |
Pages of publication | 1035 |
a | 11.2451 ± 0.0005 Å |
b | 11.7178 ± 0.0005 Å |
c | 14.2394 ± 0.0006 Å |
α | 106.876 ± 0.001° |
β | 91.234 ± 0.001° |
γ | 100.583 ± 0.001° |
Cell volume | 1759.35 ± 0.13 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0405 |
Residual factor for significantly intense reflections | 0.0347 |
Weighted residual factors for significantly intense reflections | 0.0708 |
Weighted residual factors for all reflections included in the refinement | 0.0787 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7203692.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.