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Information card for entry 7203807
Preview
Coordinates | 7203807.cif |
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Original paper (by DOI) | HTML |
Formula | C18 H8 Cu N4 S10 |
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Calculated formula | C18 H8 Cu N4 S10 |
SMILES | [Cu]12(Sc3nccnc3S2)Sc2nccnc2S1.S1C(Sc2c1csc2)=C1Sc2c(S1)csc2 |
Title of publication | Multistability in a family of DT‒TTF organic radical based compounds (DT‒TTF)4[M(L)2]3 (M = Au, Cu; L = pds, pdt, bdt) |
Authors of publication | Dias, João C.; Ribas, Xavi; Morgado, Jorge; Seiça, João; Lopes, Elsa B.; Santos, Isabel C.; Henriques, Rui T.; Almeida, Manuel; Wurst, Klaus; Foury-Leylekian, Pascale; Canadell, Enric; Vidal-Gancedo, José; Veciana, Jaume; Rovira, Concepció |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2005 |
Journal volume | 15 |
Journal issue | 31 |
Pages of publication | 3187 |
a | 11.8136 ± 0.0004 Å |
b | 10.5663 ± 0.0003 Å |
c | 18.5831 ± 0.00007 Å |
α | 90° |
β | 101.834 ± 0.002° |
γ | 90° |
Cell volume | 2270.35 ± 0.1 Å3 |
Cell temperature | 233 ± 2 K |
Ambient diffraction temperature | 233 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0657 |
Residual factor for significantly intense reflections | 0.0508 |
Weighted residual factors for significantly intense reflections | 0.1252 |
Weighted residual factors for all reflections included in the refinement | 0.13 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.105 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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