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Information card for entry 7204051
Preview
| Coordinates | 7204051.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Bis(ethylenedithio)tetrathiafulvalenium 1-pentafluorothio-1,2,2-trifluoro-ethylsulfonate (2:1) |
|---|---|
| Formula | C22 H17 F8 O3 S18 |
| Calculated formula | C21.996 H17 F7.988 O2.996 S18 |
| Title of publication | Crystal structure, physical properties and electronic structure of a new organic conductor β″-(BEDT-TTF)2SF5CHFCF2SO3 |
| Authors of publication | John A. Schlueter; Brian H. Ward; Urs Geiser; Hau H. Wang; Aravinda M. Kini; James Parakka; Emilio Morales; H.-J. Koo; M.-H. Whangbo; R. W. Winter; J. Mohtasham; Gary L. Gard |
| Journal of publication | J. Mater. Chem. |
| Year of publication | 2001 |
| Journal volume | 11 |
| Journal issue | 8 |
| Pages of publication | 2008 - 2013 |
| a | 9.2233 ± 0.0005 Å |
| b | 11.5932 ± 0.0006 Å |
| c | 17.8088 ± 0.0009 Å |
| α | 93.863 ± 0.001° |
| β | 94.543 ± 0.001° |
| γ | 103.071 ± 0.001° |
| Cell volume | 1841.94 ± 0.17 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1126 |
| Residual factor for significantly intense reflections | 0.079 |
| Weighted residual factors for significantly intense reflections | 0.171 |
| Weighted residual factors for all reflections included in the refinement | 0.1922 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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