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Information card for entry 7204076
Preview
| Coordinates | 7204076.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H20 Ga4 N2 O21 P4 |
|---|---|
| Calculated formula | C12 H12 Ga4 O21 P4 |
| SMILES | c1ccccc1.[OH2][Ga]123[O]45[Ga]67(OP(=O)(O[Ga]84(OP(=O)(O6)O[Ga]5(OP(=O)(O2)O8)(OP(=O)(O1)O7)[OH2])[OH2])O3)[OH2].c1ccccc1 |
| Title of publication | The synthesis of gallium phosphate frameworks with and without fluoride ions present: attempts to direct the synthesis of double four-ring containing materials |
| Authors of publication | Wragg, David S.; Slawin, Alexandra M. Z.; Morris, Russell E. |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2001 |
| Journal volume | 11 |
| Journal issue | 7 |
| Pages of publication | 1850 |
| a | 13.016 ± 0.003 Å |
| b | 13.016 ± 0.003 Å |
| c | 7.356 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1246.2 ± 0.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 121 |
| Hermann-Mauguin space group symbol | I -4 2 m |
| Hall space group symbol | I -4 2 |
| Residual factor for all reflections | 0.079 |
| Residual factor for significantly intense reflections | 0.0704 |
| Weighted residual factors for all reflections | 0.1953 |
| Weighted residual factors for significantly intense reflections | 0.1838 |
| Goodness-of-fit parameter for all reflections | 1.089 |
| Goodness-of-fit parameter for significantly intense reflections | 1.111 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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